Product by Industrial/Use
Products
Semiconductor
LED Probe Card
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- Application
- A probe card used to inspect each chip before package-assemblying the LED chips.
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- Characteristics
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- Almost as durable as renium tungsten (ReW).
- Resistant to surface oxidation.
- Resistant to sticky dirt and other chemical compounds.
- Little contact resistance.
- Low non-resistance at high temperatures.
- Allows great electric currents.
DDI Probe Card
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- Application
- A probe card that inspects the LCD-running IC (DDI) that is essential to activating any LCD device. DDI are found in a wide range of products, from the medium-to-large TFT LCD in laptop computers to the small TFT LCD in cell phones and color STN LCD.
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- Characteristics
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- Fine pitch response
- Min Pitch 20μｍ proven.
- PAD Size X-axis Min12μｍ proven.
- 1X2, 2X1 array test response.
- Thorough inspection using low particle needles.
ASIC Probe Card
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- Application
- A probe card used to inspect the application-specific integrated circuit (ASIC). Unlike the other ICs, ASICs are made upon customer demand, either semi-customized or fully customized. Gate area and Standard Cell incorporate ASICs.
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- Characteristics
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- AL PAD Probing
- Fine Pitch
- 2X2, 1X4, 1X8 Array response possible.
- Responses to multiple Paras possible.
Memory Probe Card
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- Application
- A probe card used to inspect (flash) memory cards used in various electronic devices, including the computer digital cameras, MP3 players, cellular phones, etc.
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- Characteristics
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- Responses to multiple pins possible.
- Responses to multiple Paras possible.
- Stable contact force.
- Long life span.