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Semiconductor
Probe Pin
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- Application
- A core part of the probe card used in semiconductor wafer inspection; probes semiconductor chips using electric signals in direct contact with the semiconductor's wafer bump.
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- Characteristics
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- Used in precise processing of the taper part using mechanical and etching processes.
- Response to various materials suitable to gold and aluminium bumps (e.g., W, ReW, Pt, Au Pin, P7…)